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Cost reduction in mutation testing with bytecode-level mutants classification
Authors:
- Joanna Strug,
- Barbara Strug
- Record ID
- CUT6fdb059c730b4dff83d6e0a7a959f7a2
- Publication categories
- ; ;
- Author
- Pages
- 714-723
- Other elements of collation
- tab.; Bibliografia (na s.) - 722-723; Bibliografia (liczba pozycji) - 17; Oznaczenie streszczenia - Abstr.; Numeracja w czasopiśmie - 10841
- Book
- Rutkowski Leszek, Leszek Rutkowski Scherer Rafał, Rafał Scherer Korytkowski Marcin Marcin Korytkowski [et al.] (eds.): Artificial Intelligence and Soft Computing : 17th International Conference, ICAISC 2018, Zakopane, Poland, June 3-7, 2018 : proceedings, Pt. 1, Lecture Notes in Artificial Intelligence, 2018, Cham, Springer, Springer, ISBN 978-3-319-91253-0 (eBook)
- Keywords in English
- machine learning, mutation testing, bytecode distance, classification, test evaluation
- DOI
- DOI:10.1007/978-3-319-91253-0_66 Opening in a new tab
- URL
- https://link.springer.com/chapter/10.1007%2F978-3-319-91253-0_66 Opening in a new tab
- Language
- eng (en) English
- Score (nominal)
- 20
- Additional fields
- Indeksowana w: Web of Science, Scopus, CORE
- Uniform Resource Identifier
- https://cris.pk.edu.pl/info/article/CUT6fdb059c730b4dff83d6e0a7a959f7a2/
- URN
urn:pkr-prod:CUT6fdb059c730b4dff83d6e0a7a959f7a2
* presented citation count is obtained through Internet information analysis, and it is close to the number calculated by the Publish or PerishOpening in a new tab system.