Damage range in swift Xe26+ ion-irradiated polycrystalline iron and silver studied by positron annihilation technique, long-range effect
Authors:
- J. Dryzek,
- P. Horodek,
- M. Dryzek
Abstract
Investigations of defects and their spatial distribution in iron and silver irradiated with swift Xe 26+ ions of different energies: 18.5, 45.5, 122.5 and 167 MeV have been performed using conventional positron lifetime spectroscopy. In the implanted layer, in which the ions are stopped, dislocations and clusters of vacancies were found in iron and only dislocations in sliver. In both metals, an extended layer of damage with defects was detected beyond the implanted layer. The origin of this extended layer can be explained by the depth distribution of the stress caused by swift ions in the implanted layer. The calculations using a finite element method indicates that the stress value in the implanted layer, i.e., about 1 GPa for iron and 0.5 GPa for silver exceeds several times the yield strength.
- Record ID
- CUTa2d86725224d4c88b0e8c5d8d429282e
- Publication categories
- ;
- Author
- Journal series
- Applied Physics A-Materials Science & Processing, ISSN 0947-8396, e-ISSN 1432-0630
- Issue year
- 2018
- Vol
- 124
- No
- 6
- Pages
- [1-11]
- Article number
- 451
- Other elements of collation
- schem.; wykr.; Bibliografia (na s.) - 10-11; Bibliografia (liczba pozycji) - 35; Oznaczenie streszczenia - Abst.; Numeracja w czasopiśmie - Vol. 124, Iss. 6
- Keywords in English
- implanted layer, damage detection, depth distribution, positron lifetime spectroscopy, stress values, long range effects
- DOI
- DOI:10.1007/s00339-018-1866-0 Opening in a new tab
- URL
- https://link.springer.com/article/10.1007/s00339-018-1866-0 Opening in a new tab
- Language
- eng (en) English
- License
- Score (nominal)
- 30
- Additional fields
- Indeksowana w: Web of Science, Scopus
- Uniform Resource Identifier
- https://cris.pk.edu.pl/info/article/CUTa2d86725224d4c88b0e8c5d8d429282e/
- URN
urn:pkr-prod:CUTa2d86725224d4c88b0e8c5d8d429282e
* presented citation count is obtained through Internet information analysis, and it is close to the number calculated by the Publish or PerishOpening in a new tab system.